Suzhou Gnd Test Technology Co., Ltd. was established in 2021 and is located in Suzhou High tech Zone, Jiangsu Province, which has the highest per capita GDP in China. With the rapid development of integrated circuits in China, the company focuses on the research of test probe technology in the testing process of integrated circuits. Through continuous learning, exploration and research, the company has localized the design and production processes of semiconductor test probes.
The company combines theoretical design, simulation, manufacturing, and practical operation of industry backbone personnel in the testing field to provide customers with preferred solutions. At present, the product has been validated by multiple companies in the market and has gained a good reputation. At the beginning of its establishment, the company focused on the independent and controllable production process technology. In 2024, it added a semiconductor probe component processing department, and in 2025, it introduced relevant Japanese technical personnel to break through the bottleneck of semiconductor testing probe electroplating technology. By laying out core processes such as precision machining, precision electroplating, and precision assembly, it achieved technological breakthroughs, independent controllability, and greater market initiative. The company is committed to improving the domestic chip testing supply chain system and striving to become a core supplier of integrated circuit testing.
2021- Company registration and establishment
2023- Products will be shipped externally and sales will be achieved that year.
2024- Increase precision component processing layout and connect upstream supply chains.
2025- Hire Japanese experts to solve the current problem of electroplating bottleneck in China.
2026- The company will continue to increase investment, continuously increase processing equipment, and better serve customers.
In the next three years, we will improve our industrial layout and strive to become the main domestic supplier of semiconductor chip testing probes, fully replacing Japanese and Korean suppliers.
