Applied to wafer CP probe testing, packaged FT function testing, and compatible with logic, storage, and power semiconductor chips of all categories; Micro probes contact micro level solder pads, with low impedance and long durability, accurately screen out defective wafers with leakage and short circuits, and improve chip factory yield.
Service GPU, AI computing chips, high-speed storage, server board testing; The low loss coating probe is suitable for high-frequency and high-speed signals and high current testing, with a durability cycle of millions of times, meeting the high-precision and high load automation detection requirements of computing hardware.
Covering industrial control PLC, IoT sensing modules, and vehicle interconnection hardware detection; Corrosion resistant and wide temperature range specialized probes are suitable for long-term continuous testing in industry. Micro sized probes are compatible with micro sensing components, and their rigorous durability performance matches vehicle specifications and industrial grade product quality inspection standards.
